材料科学
电阻率和电导率
微观结构
吸收(声学)
透射电子显微镜
正交晶系
钨
红外线的
分析化学(期刊)
光学
结晶学
化学
晶体结构
纳米技术
复合材料
冶金
工程类
色谱法
电气工程
物理
作者
Keiichi Sato,Isao Ando,Satoshi Yoshio,Kenji Adachi
摘要
Sputtered thin films with strong near-infrared absorption and high visible transmission and electrical resistivity (≥102 Ω cm) have been obtained using highly conductive cesium tungsten bronze targets. The origin of the low electrical conductivity and high near-infrared absorption of the films has been investigated by focusing on internal defects and reported in two parts. In Paper I, the optical and electrical properties of the films and their microstructural characterization using x-ray diffraction and high-resolution transmission electron microscopy are presented. Abundant planar W and Cs defects were found on hexagonal prismatic planes that locally expanded the defect plane and triggered the hexagonal-to-orthorhombic crystallographic transition. These cationic defects diminished conduction electrons and suppressed electrical conduction, whereas oxygen vacancies generated W5+-trapped electrons to activate polaronic excitations for strong near-infrared absorption.
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