光学
光谱学
材料科学
波长
选择(遗传算法)
内容(测量理论)
折射率
杂散光
光散射
遥感
可见光谱
分析化学(期刊)
光谱辐射计
信噪比(成像)
衰减系数
干物质
光强度
反射率
质量(理念)
紫外可见光谱
作者
Qingxiao Ma,GuoAo Xie,Longyan Zhang,Jie Ren,Feiming Li
出处
期刊:Applied optics-OT
[Optica Publishing Group]
日期:2026-07-13
卷期号:65 (23): 7769-7769
摘要
A rapid and non-destructive method for predicting dry matter (DM) content in leeks was developed using visible and near-infrared (Vis-NIR) spectroscopy, coupled with what we believe to be a novel wavelength selection algorithm. Reflectance spectra (397.7–1716.7 nm) were acquired from 288 leek samples collected from three production areas in Nantong, China, and DM content was determined by oven-drying. The full-spectrum partial least squares (PLS) model yielded moderate prediction accuracy, with R P 2 of 0.7963 and RMSE P of 1.14%. To improve performance, the iterative ranking-based variable elimination PLS (IRIVE-PLS) algorithm was proposed, which integrates multiple importance metrics to iteratively eliminate uninformative wavelengths. The algorithm autonomously identified the red-edge region (680–780 nm) as the most informative spectral feature, enriching its proportion from 9.5% in the full spectrum to 10.6% in the selected set. The IRIVE-PLS model achieved excellent prediction performance, yielding R P 2 of 0.9683 and RMSE P of 0.45%, significantly outperforming conventional wavelength selection methods. The proposed approach provides an accurate, interpretable, and non-destructive alternative for leek quality assessment, with strong potential for online sorting applications in the vegetable industry.
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