现场可编程门阵列
微电子机械系统
门阵列
电场
领域(数学)
光电子学
材料科学
物理
光学
计算机科学
计算机硬件
数学
纯数学
量子力学
作者
Takaki Itoh,Toshiyuki Nakaie
标识
DOI:10.1541/ieejsmas.138.74
摘要
This study develops a real-time system for visualizing electrostatic field distribution measurements. The system is based on a field programmable gate array (FPGA) and uses a microelectromechanical systems (MEMS) micromirror array. Subsequently, the electrostatic field distribution was visualized through the FPGA-based soft-core processor. The maximum and minimum full-scale errors of the developed system were 4.5% FS and 0.2% FS, respectively. In measuring a single point charge with 5% FS, the developed system performed equivalently to that of an electrostatic sensor.
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