In-situ TEM imaging of Novel Edge Reconstruction in Bilayer Phosphorene

Journal Article In-situ TEM imaging of Novel Edge Reconstruction in Bilayer Phosphorene Get access Sol Lee, Sol Lee Department of Physics, Yonsei University, Seoul, KoreaCenter for Nanomedicine, Institute for Basic Science (IBS), Seoul, Korea Search for other works by this author on: Oxford Academic Google Scholar Yangjin Lee, Yangjin Lee Department of Physics, Yonsei University, Seoul, KoreaCenter for Nanomedicine, Institute for Basic Science (IBS), Seoul, Korea Search for other works by this author on: Oxford Academic Google Scholar Li Ping Ding, Li Ping Ding Department of Optoelectronic Science & Technology, School of Electronic Information and Artificial Intelligence, Shaanxi University of Science & Technology, Xi'an, ChinaCenter for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan, Korea Search for other works by this author on: Oxford Academic Google Scholar Kihyun Lee, Kihyun Lee Department of Physics, Yonsei University, Seoul, Korea Search for other works by this author on: Oxford Academic Google Scholar Feng Ding, Feng Ding Center for Multidimensional Carbon Materials, Institute for Basic Science (IBS), Ulsan, KoreaDepartment of Materials Science and Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan, Korea Search for other works by this author on: Oxford Academic Google Scholar Kwanpyo Kim Kwanpyo Kim Department of Physics, Yonsei University, Seoul, KoreaCenter for Nanomedicine, Institute for Basic Science (IBS), Seoul, Korea Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 28, Issue S1, 1 August 2022, Pages 2310–2311, https://doi.org/10.1017/S143192762200887X Published: 01 August 2022