汽车工业
汽车工程
认证
机制(生物学)
嵌入式系统
计算机科学
断层(地质)
工程类
电子工程
政治学
认识论
地质学
哲学
航空航天工程
地震学
法学
作者
Kyung-Hoon Lee,Jin-Woo Park,Younghyo Park,Byeongwoo Koo,Sunghan Do,Woongtaek Lim,Sungno Lee,Hyo-Chul Shin,Eunhye Oh,Young‐Jae Cho,Michael Choi,Jongshin Shin
标识
DOI:10.1109/vlsitechnologyandcir46769.2022.9830347
摘要
This paper presents the highest automotive safety integrity level (ASIL-D) certified safety mechanism in analog-to-digital converter (ADC) and digital-to-analog converter (DAC) for communication application. The safety mechanism with built-in-self-test (BIST) monitors 3 safety items in real time and checks periodically 15 safety items of mixed-signal functionality. The ADC and DAC embedded with safety mechanisms are the first published converter IPs achieving ASIL-D certification, which show the highest fault coverage compared with previously published ASIL IPs/Chips.
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