微观结构
材料科学
微晶
基质(水族馆)
曲面(拓扑)
分析化学(期刊)
原子物理学
复合材料
冶金
化学
物理
海洋学
几何学
数学
色谱法
地质学
作者
Wolf‐Dieter Schneider,C. Laubschat,B. Reihl
出处
期刊:Physical review
[American Physical Society]
日期:1983-05-15
卷期号:27 (10): 6538-6541
被引量:84
标识
DOI:10.1103/physrevb.27.6538
摘要
In situ evaporated polycrystalline Yb films at different substrate temperatures ($10<T<~300$ K) were studied by surface-sensitive photoemission ($h\ensuremath{\nu}=40.8$ eV). The presence of substrcture in the surface-derived $4{f}^{13}$ components allowed an identification of multiple surface shifts as being due to different coordination numbers of surface atoms. The temperature-dependent intensity variation of the surface emission could be correlated with the temperature-dependent change of the surface microstructure.
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