材料科学
肖特基二极管
电流(流体)
GSM演进的增强数据速率
肖特基势垒
光电子学
二极管
六方晶系
工程物理
电气工程
结晶学
电信
计算机科学
工程类
化学
作者
Roland Rupp,R. Gerlach,A. Kabakow
出处
期刊:Materials Science Forum
日期:2012-05-14
卷期号:717-720: 929-932
被引量:13
标识
DOI:10.4028/www.scientific.net/msf.717-720.929
摘要
The forward current distribution in SiC 600V merged pn-Schottky (MPS) diodes is visualized with the help of emission microscopy at various current densities. It is shown how the light emission develops with increasing current densities and extends from the Schottky contact areas into the pn junction areas. Large p + -regions e.g. in the edge termination contribute first by minority carrier injection, whereas the smaller p + hexagonal cells and the p + grid follow subsequently.
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