Tensil Test of Corrugated 8 YSZ Thin Films for SOFC

Spatial fluctuatlons in temperature in planar solid oxide fuel cells(SOFCs)㏄lls，and differences in the thermal expansion c㏄fficients between ceramic elcctrolyte and metal cell component materials affect the perfomlance and durability of plamr SOFC stacks。In this study，We developedamethodtopre卿e8mol％Y203-ZIO2(8YSZ)thinfilmshavingoormgated structures to release the the㎜田stresses．Ni foil substrates were con触gated by folding，and8YSZ thin films were deposited on the substrates by electron beam evapo-ation。The substrates were dissolved in Fe(コ13aqueous solution，and8YSZ thin films with corrugated patterns were obtained．The tensile stre皿gth of the films was measured。The differen㏄in strain between 8YSZandNicomponen的at1000。Cw認c飢culatedfromthelr血emalexpansio血c㏄fficien総． By comparing the experimental data with the calculated value，it is expected that the themal stresses can be released by Qomga n88YSZ electro豆yte f ms．