谱线
光谱学
材料科学
高分辨率
多普勒展宽
分辨率(逻辑)
原子物理学
凝聚态物理
光学
分子物理学
物理
地质学
量子力学
遥感
人工智能
计算机科学
作者
М. Н. Попова,E. P. Chukalina,С. А. Климин,Ming‐Chung Chou
摘要
Abstract The shape and fine structure of lines due to Tm 3+ f − f electronic transitions in multifunctional Y 3 Al 5 O 12 garnet crystals have been studied by high-resolution spectroscopy. The observed inhomogeneously broadened lines have a Lorentzian shape, suggesting that point defects make a predominant contribution to the inhomogeneous broadening. Moreover, Y Al antisite defects, which are formed during high-temperature melt growth, produce spectral satellites near the main lines.
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