William D. Hinsberg,Gregory M. Wallraff,Robert D. Allen
出处
期刊:日期:2002-07-15
标识
DOI:10.1002/0471440264.pst183
摘要
Abstract An introduction to lithographic resists is presented. The principles of lithography are described and the essential attributes resist materials must possess are enumerated. The chemical and physical properties of resists of current technological importance are discussed within this framework, with an emphasis on how functional performance is related to these properties. Finally, examples are provided of how resist materials are being tailored for future lithographic imaging technologies.