高电子迁移率晶体管
电阻式触摸屏
氮化镓
导纳
晶体管
材料科学
光电子学
等效电路
导纳参数
电子工程
电压
电气工程
工程类
电阻抗
图层(电子)
复合材料
作者
Aakash Jadhav,Takashi Ozawa,Ali Baratov,Joel T. Asubar,Masaaki Kuzuhara,Akio Wakejima,Shunpei Yamashita,Manato Deki,Shugo Nitta,Yoshio Honda,Hiroshi Amano,Sourajeet Roy,Biplab Sarkar
标识
DOI:10.1109/jeds.2022.3208028
摘要
In this paper, a technique to develop small signal circuit (SSC) models of AlGaN/GaN high electron mobility transistors (HEMTs) using dependent current sources is presented. In this technique, experimentally measured broadband Y-parameters of AlGaN/GaN HEMTs are mathematically modeled as a sum of pole-residue terms. By representing each pole-residue term as a dependent current source, it is possible to develop an accurate SSC models for HEMTs which otherwise may not be possible using passive resistive-inductive-capacitive elements. The accuracy of the proposed SSC model is validated against the conventional SSC model using a 2nd, 3rd and 4th order rational function representation of the admittance branches of AlGaN/GaN HEMTs. Therefore, the proposed SSC model turns out to be highly robust in nature and can take care of any form of the transfer functions of the admittance branches between the gate, drain, and source terminal of an AlGaN/GaN HEMT.
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