Non-periodicity of peak-to-peak distances in x-ray diffraction spectrums from perfect superlattices

X-ray diffraction investigations of type II InAs/GaSb superlattice on a GaSb(001) substrate are presented. The wide range of diffraction angles (2θ/ω scans) covering 002 and 004 reflections was examined at Petra III synchrotron. The angular region between 002 and 004 reflections was the most interesting part of the measured diffraction profile. In this region, a non-coincidence of superlattice satellite peaks belonging to these two reflections is observed. The multiple-beam dynamical diffraction approach was used for correct simulation of the observed diffraction profile.