Investigating the Roughness of Peach During Controlled Atmosphere Storage by Atomic Force Microscopy

The degree of shriveling is important in determining the quality of produce. Weight loss is often used to express shriveling. A new way, called roughness of peach skin analyzed by atomic force microscopy (AFM), was proposed to denote the degree of shriveling. The outcome of roughness analysis accorded well with that of weight loss, but showed discrepancy among different groups. The three-dimensional profile of the skin could also be gained by AFM. It showed that the roughness analysis measured by AFM effectively measured the shriveling of the peach during storage.