吸收边
K-边
光子能量
扩展X射线吸收精细结构
吸收(声学)
质量衰减系数
分析化学(期刊)
原子物理学
航程(航空)
衰减
衰减系数
化学
散射
能量(信号处理)
光子
吸收光谱法
材料科学
带隙
物理
光学
凝聚态物理
复合材料
量子力学
色谱法
作者
Basavaraj Rachappa Kerur,S.R. Thontadarya,B. Hanumaiah
标识
DOI:10.1002/xrs.1300220308
摘要
Abstract The x‐ray mass attenuation coefficients were measured around the K‐absorption edges of elements in the range 16 ⩽ Z ⩽ 30 using Fe Kα x‐rays of energy 6.400 keV, which is the weighted average energy of Kα 1 and Kα 2 x‐ray components from the 57 Co radioactive source. Kβ x‐rays were almost eliminated by the differential absorption technique. The small difference in energy between Kα 1 and Kα 2 , 13 eV, was shown to be inconsequential by comparing the measured and theoretical values of μ/ρ for standard materials such as Al, Cu, Mo and Ta. The effect of fine structure of the K‐absorption edge on μ/ρ was elucidated by using the compounds of elements in the range 16 ⩽ Z ⩽ 30, containing one element with its K‐absorption edge energy ( E k ) close to the incident photon energy ( E x ). The results clearly indicate the validity of the theoretical mixture rule for all those compounds whose K edge is far away from the incident energy but show deviations of as much as 10% for the manganese compound whose K edge is 140 eV above E x and about 12% for the chromium compound whose K edge is 410 eV below E x . These deviations are attributed to the possible influence of resonance Raman scattering when the incident photon energy E x is less than the edge energy and to the influence of EXAFS when E x is more than the edge energy.
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