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Final report of CCQM-K129 Measurement of Mole Fractions of Cu, In, Ga and Se in Cu(In,Ga)Se2 Films

摩尔分数 分析化学(期刊) 硒化铜铟镓太阳电池 X射线光电子能谱 二次离子质谱法 标准物质 材料科学 化学 质谱法 薄膜 物理 物理化学 核磁共振 纳米技术 色谱法 检出限
作者
K. J. Kim,A. S. Kim,Jong Shik Jang,J. Suh,Thomas Wirth,Wolfgang E. S. Unger,Vasile‐Dan Hodoroaba,Joyce R. Araújo,Bráulio S. Archanjo,Carlos Galhardo,J. C. Damasceno,C. A. Achete,H. Wang,M. Wang,J. Bennett,D. Simon,A. Kurokawa,S. Terauchi,T. Fujimoto,C. Streeck
出处
期刊:Metrologia [IOP Publishing]
卷期号:53 (1A): 08011-08011 被引量:6
标识
DOI:10.1088/0026-1394/53/1a/08011
摘要

CCQM key comparison K-129 for the quantitative analysis of Cu(In,Ga)Se 2 (CIGS) films has been performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The objective of this key comparison is to compare the equivalency of the National Metrology Institutes (NMIs) and Designated Institutes (DIs) for the measurement of mole fractions of Cu, In, Ga and Se in a thin CIGS film. The measurand of this key comparison is the average mole fractions of Cu, In, Ga and Se of a test CIGS alloy film in the unit of mole fraction (mol/mol). Mole fraction with the metrological unit of % mol/mol can be practically converted to atomic fraction with the unit of at %. In this key comparison, a CIGS film with certified mole fractions was supplied as a reference specimen to determine the relative sensitivity factors (RSFs) of Cu, In, Ga and Se. The mole fractions of the reference specimen were certified by isotope dilution - inductively coupled plasma/mass spectrometry (ID-ICP/MS). A total number counting (TNC) method was recommended as a method to determine the signal intensities of the constituent elements acquired in the depth profiles by Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES). Seven NMIs and one DI participated in this key comparison. The mole fractions of the CIGS films were measured by depth profiling based-SIMS, AES and XPS. In this key comparison, the average degrees of equivalence uncertainties for Cu, In, Ga and Se are 0.0093 mol/mol, 0.0123 mol/mol, 0.0047 mol/mol and 0.0228 mol/mol, respectively. Main text To reach the main text of this paper, click on Final Report . Note that this text is that which appears in Appendix B of the BIPM key comparison database kcdb.bipm.org/ . The final report has been peer-reviewed and approved for publication by the CCQM, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).

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