三氧化钨
材料科学
拉曼光谱
退火(玻璃)
钨
薄膜
插层(化学)
升华(心理学)
三氧化物
化学工程
结晶学
纳米技术
无机化学
化学
复合材料
光学
冶金
工程类
心理学
物理
心理治疗师
硫黄
作者
Kourosh Kalantar‐Zadeh,Aravind Vijayaraghavan,Moon‐Ho Ham,Haidong Zheng,Michael Breedon,Michael S. Strano
摘要
Atomically thin WO3 is fabricated using a three-step process, involving wet-chemical synthesis of hydrated-WO3, mechanical exfoliation of fundamental layers and dehydration by annealing at 300 ºC. Atomic force microscopy reveals that the minimum resolvable thickness of the hydrated flakes to be ~1.4 nm, which corresponds to the unit-cell height. The subsequent annealing temperature determines the degree of dehydration and thereby the crystallographic structure of the resultant WO3. The hydrated and dehydrated flakes are characterized by Raman spectroscopy to reveal spectroscopic fingerprints of flake thickness. Thin flakes are also shown to have higher propensity for lithium intercalation, which is also evidenced in Raman planar peak intensity.
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