Nanoscale Characterization of Ferroelectric Materials for Piezoelectric Applications

In this work, the nanoscale electromechanical properties of Pb-based perovskites that are currently the main candidates for piezoelectric applications are investigated by Piezoresponse Force Microscopy (PFM). Local response is compared with that studied via conventional technique. The effect of local polarization switching by mechanical force is demonstrated. This effect may limit the functionality of the films in piezoelectric applications. Local piezoelectric nonlinearity, as well as the nanoscale degradation are also studied by PFM. These measurements demonstrate that the defects may act as pinning centers for domain walls and thus influence nanoscale properties. Finally, local properties of ferroelectric relaxors are presented.