凝聚态物理
费米能级
拉曼光谱
角分辨光电子能谱
材料科学
电阻率和电导率
X射线光电子能谱
电子结构
带隙
光电发射光谱学
物理
核磁共振
电子
光学
量子力学
作者
Sambhab Dan,Shiv Kumar,Shovan Dan,Debarati Pal,Swapnil Patil,Abhineet Verma,Satyen Saha,K. Shimada,Sandip Chatterjee
摘要
Observation of a broad peak in the temperature (T) dependent resistivity (ρ) in Cu substituted Bi2Te3 has been reported earlier, though its origin remains obscured to date. Our investigation reveals that an electronic phase transition accompanied by Fermi level tuning primarily contributes toward the observed ρ(T). The analysis reveals that tuning of the Fermi level affects bulk transport phenomena to produce the unique ρ(T). We have proposed a model to show how the bulk bandgap can affect ρ(T). We have shown that bulk carrier contribution has a greater role in producing such ρ(T), and a detailed discussion supported by temperature dependent ARPES study, Raman study, and XPS study as well as structural study conducted by x-ray diffraction has been presented.
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