X射线光电子能谱
X射线
材料科学
物理
核磁共振
光学
作者
H. Bubert,John C. Rivière,Wolfgang Werner
标识
DOI:10.1002/9783527636921.ch2
摘要
This chapter contains sections titled: Principles Instrumentation Spectral Information and Chemical Shifts Quantification, Depth Profiling, and Imaging The Auger Parameter Applications Ultraviolet Photoelectron Spectroscopy (UPS) References
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