钙钛矿(结构)
导电体
各向异性
材料科学
压力(语言学)
探测器
热的
X射线探测器
光电子学
工程物理
复合材料
光学
物理
结晶学
化学
热力学
语言学
哲学
作者
Ting Han,De Ning,Hao Liu,Yong Xiang,Xin Yu Wang
标识
DOI:10.1088/1742-6596/3008/1/012064
摘要
Abstract Perovskite materials exhibit considerable potential for X-ray detection, owing to their combination of high sensitivity, low power consumption, and flexibility. However, a recognized challenge for such devices pertains to their mechanical stability under operational conditions. In this study, we propose a strategy of inserting an anisotropic conductive film (ACF) as a stress buffer layer, achieving robust mechanical interconnection between ITO and CsPbI 3 perovskite thick films. The perovskite detector, when operated under a bias voltage of 5 V, demonstrates a dark current below 1 nA cm −2 and a low detection limit of 53 nGy air s −1 . Notably, this X-ray response remains at its initial value even after 60 days of exposure to ambient conditions. This method provides new insights and pathways for the manufacture of high-stability perovskite thick-film photodetectors.
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