Andrea Cordaro,Hoyeong Kwon,Dimitrios L. Sounas,Albert Polman,Andrea Alù
出处
期刊:Conference on Lasers and Electro-Optics日期:2018-01-01卷期号:: FF3C.4-FF3C.4
标识
DOI:10.1364/cleo_qels.2018.ff3c.4
摘要
We present Si-based metasurfaces with suitably engineered spatial dispersion and non-locality that can perform even and odd mathematical operations on an input image, enabling all-analog signal processing and on-the-fly edge detection.