硅
黑硅
材料科学
小学生
计算机科学
光学
光电子学
物理
作者
Ron Shiri,Christine A. Jhabvala,Georgi T. Georgiev,Alyssa Barlis,Rémi Soummer,Peter Petrone,Marc J. Kuchner,Edward J. Wollack,Michael P. Biskach,Timo T. Saha,Will Zhang,James J. Butler
摘要
Many of NASA's direct imaging of exoplanet missions and projects require fabricated coronagraph masks to control scattering and diffraction of light. The designed, patterned mask intended for the coronagraphic testbeds are highly absorptive in the visible range on non-metallic regions. In this work, we employed the cryogenic etching process to fabricate black silicon (BSi) to achieve a high aspect ratio (HAR) structures with higher etch rate than conventional reactive ion etching (REI). Recent bidirectional reflectance distribution function (BRDF) measurements of uniformly etched BSi on silicon wafer show highly diffusive BSi with a specular reflective component in the orders of seven magnitudes lower than the total hemispherical reflectance when the polarized or non-polarized incident beam is used.
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