电容器
等效串联电阻
电阻抗
老化
电容
滤波电容器
寄生元件
薄膜电容器
材料科学
寄生电容
电磁兼容性
电子工程
电气工程
工程类
电压
物理
电极
遗传学
量子力学
生物
作者
Hao Líu,Guy A. E. Vandenbosch,Tim Claeys,Davy Pissoort
出处
期刊:IEEE Transactions on Dielectrics and Electrical Insulation
[Institute of Electrical and Electronics Engineers]
日期:2020-06-01
卷期号:27 (3): 980-988
被引量:4
标识
DOI:10.1109/tdei.2019.008542
摘要
Capacitors are ubiquitous in electronic devices and play a critical role in the devices' electromagnetic compatibility performance. The ageing of capacitors, due to intrinsic degradation mechanisms and external thermal and electrical stresses, has drawn a wide attention in the reliability field. The variations of the capacitance and equivalent series resistance are typically seen as representative for the ageing of capacitors, while the other parasitic parameters are usually neglected. In this study, a new full-parameter ageing modelling approach of capacitors is proposed based on complex impedance analysis. The ageing characteristics of all the proposed 7 parameters, including all parasitic parameters, are identified by carrying out an electrical overstress accelerated ageing test.
科研通智能强力驱动
Strongly Powered by AbleSci AI