卤化物
材料科学
钥匙(锁)
金属
冶金
辐射
理论(学习稳定性)
化学
纳米技术
辐射损伤
作者
Xiaoqing Liu,Shuai Lu,Guoqiang Luo,Guangda Niu,Jiang Tang,Mengling Xia
标识
DOI:10.1021/acsenergylett.6c00941
摘要
Metal halide perovskites show great promise as candidates for next-generation high-energy radiation detection, competing with traditional scintillators and semiconductors owing to their high sensitivity and defect tolerance. However, the deployment of robust detectors is currently impeded by inconsistent stability assessments and a lack of rational design principles for radiation hardening. This review addresses these challenges by examining the radiation damage mechanisms specific to various sources, decoupling the complex interplay between ionization-induced self-healing and displacement damage accumulation within the unique soft lattice. We analyze how compositional engineering and dimensionality reduction can effectively suppress defect propagation. Crucially, we identify that long-term reliability is often limited by extrinsic device interfaces rather than the intrinsic perovskite bulk. Furthermore, we highlight the limitations of generic laboratory radiation sources and propose a transition toward application-specific evaluation protocols that distinguish between transient artifacts and intrinsic material degradation. This review aims to provide theoretical guidance and references for designing the next generation of highly radiation-stable perovskite materials and devices.
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