薄膜晶体管
材料科学
光电子学
AMOLED公司
有机发光二极管
原子层沉积
氧化物
可靠性(半导体)
过程(计算)
晶体管
氧化物薄膜晶体管
可控性
栅氧化层
有源矩阵
图层(电子)
二极管
绝缘体(电)
电子工程
等效氧化层厚度
溶解过程
进程窗口
频道(广播)
逻辑门
制作
高-κ电介质
高分辨率
薄膜
CMOS芯片
纳米技术
纳米电子学
过程控制
过程开发
作者
Seung-Chan Choi,Kyung-Chul Ok,Jung-Seok Seo,Jae-Man Jang,Jae-Yoon Park,Jun-Ho Lee,Ji-Yong Noh,Tae-Hyoung Moon,Kwon-Shik Park,Soo-Young Yoon
摘要
Oxide thin film transistors (TFTs) have been successfully developed by using atomic layer deposition (ALD) process in terms of gate insulator (GI) and oxide channel layer. Oxide TFTs fabricated by ALD process have the several advantages in device reliability and chemical composition controllability over a wide range of mobilities. In this paper, the high mobility (~40cm2/Vs) and high reliability of oxide TFTs fabricated by ALD process are discussed, and a high resolution (441ppi), high operation frequency (120Hz), 6.58‐inch AMOLED panel with an LTPO structure is demonstrated
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