Silicide technology for USJ in next technology node
作者
K. Suguro,T. Iinuma,Mitsuaki Izuha,K. Ohuchi,A. Hokazono,K. Miyano,Ichiro Mizushima
标识
DOI:10.1109/iwjt.2002.1225206
摘要
Silicide technology for ultra-shallow junction in next technology node is discussed. Salicide material is changed from low resistivity refractory metal silicide to near-noble metal silicide from the view point of less consumption of Si by silicidation. The pn junction leakage for shallow S/D can be drastically improved by NiSi as compared with CoSi/sub 2/.