中子反射计
镜面反射
反射计
散射
光学
中子散射
中子
材料科学
聚合物
小角中子散射
物理
核物理学
计算机科学
复合材料
时域
计算机视觉
作者
Aljoša Hafner,Philipp Gutfreund,B.P. Toperverg,Mark Geoghegan,Michele Sferrazza
标识
DOI:10.1088/1361-648x/ac0282
摘要
Specular and off-specular neutron reflectometry have been used in a combined approach to study thin polymer films. Our goal in this work is to illustrate the power of the off-specular scattering technique to probe the properties of the buried interface of immiscible polymer bilayers of deuterated polystyrene and protonated poly(methyl methacrylate) (h-PMMA). The diffuse scattering stemming from these systems is discussed in relation to thermal fluctuations at the polymer/polymer interface, providing a means to extract in-plane correlation lengths from buried interfaces. In addition the onset of hole formation in the top layer is evidenced by the diffuse scattering, not easily detectable by specular reflection alone.
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