磁力显微镜
校准
原子力显微镜
显微镜
纳米尺度
磁场
分辨率(逻辑)
纳米技术
材料科学
计算机科学
物理
光学
人工智能
磁化
量子力学
作者
Héctor Corte‐León,V. Neu,Alessandra Manzin,Craig Barton,Yuanjun Tang,Manuela Gerken,Petr Klapetek,H. W. Schumacher,Olga Kazakova
出处
期刊:Small
[Wiley]
日期:2020-03-01
卷期号:16 (11)
被引量:2
标识
DOI:10.1002/smll.202070058
摘要
Magnetic force microscopy (MFM), which allows mapping of the magnetic field distribution with nanoscale resolution, is a well-known tool. However, for the last two decades, calibration was available only to a few labs. Now, after a few years of active research, the calibration protocols have been reviewed and improved, making it available to every laboratory. In article number 1906144, Héctor Corte-León and co-workers show the progress done toward making quantitative MFM a common tool in nanocharacterization laboratories.
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