氢
氮化物
硅
氮化硅
材料科学
分析化学(期刊)
等离子体
无机化学
化学
冶金
纳米技术
环境化学
量子力学
物理
有机化学
图层(电子)
作者
Ray Chow,W. A. Lanford,Keming Wang,Richard S. Rosler
摘要
The hydrogen contents and etch rates have been measured for plasma-deposited silicon nitrides made in nine different commercially available reactors as well as for some low pressure chemical vapor deposited nitrides. The hydrogen contents vary from 4% to 39% (atomic). A correlation is observed between etch rate and hydrogen content, with etch rates varying over three orders of magnitude.
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