MOSFET
电场
材料科学
电压
光电子学
电气工程
炸薯条
工程物理
高压
工程类
晶体管
物理
量子力学
作者
Pengfei Wu,Yunlai An,Shuai Sun,Zhaocheng Liu,Zhibin Zhao,Xuebao Li
标识
DOI:10.1109/peas58692.2023.10394717
摘要
In this paper, the influence of the packaging on the high voltage SiC MOSFET termination is given. First, the electric field modelling of SiC MOSFET termination with packaging considered is given. Then, by comparing the difference of the electric field distribution of the termination with and without the packaging, the influence of packaging on the chip termination is investigated. At last, the influence of the interface charge density at the interface between packaging and chip termination on the electric field distribution is discussed. This work will benefit to the design of the termination design of the high voltage SiC MOSFET.
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