Convolutional Neural Network for Interface Defect Detection in Adhesively Bonded Dissimilar Structures

卷积神经网络 材料科学 接口(物质) 计算机科学 复合材料 人工智能 毛细管数 毛细管作用
作者
Damira Smagulova,Vykintas Samaitis,Elena Jasiūnienė
出处
期刊:Applied sciences [Multidisciplinary Digital Publishing Institute]
卷期号:14 (22): 10351-10351 被引量:3
标识
DOI:10.3390/app142210351
摘要

This study presents an ultrasonic non-destructive method with convolutional neural networks (CNN) used for the detection of interface defects in adhesively bonded dissimilar structures. Adhesive bonding, as the weakest part of such structures, is prone to defects, making their detection challenging due to various factors, including surface curvature, which causes amplitude variations. Conventional non-destructive methods and processing algorithms may be insufficient to enhance detectability, as some influential factors cannot be fully eliminated. Even after aligning signals reflected from the sample surface and interface, in some cases, due to non-parallel interfaces, persistent amplitude variations remain, significantly affecting defect detectability. To address this problem, a proposed method that integrates ultrasonic NDT and CNN, and which is able to recognize complex patterns and non-linear relationships, is developed in this work. Traditional ultrasonic pulse-echo testing was performed on adhesive structures to collect experimental data and generate C-scan images, covering the time gate from the first interface reflection to the time point where the reflections were attenuated. Two classes of datasets, representing defective and defect-free areas, were fed into the neural network. One subset of the dataset was used for model training, while another subset was used for model validation. Additionally, data collected from a different sample during an independent experiment were used to evaluate the generalization and performance of the neural network. The results demonstrated that the integration of a CNN enabled high prediction accuracy and automation of the analysis process, enhancing efficiency and reliability in detecting interface defects.
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