卤化物
压电
材料科学
薄膜
铁电性
压电系数
钙钛矿(结构)
Crystal(编程语言)
单晶
分析化学(期刊)
电介质
复合材料
纳米技术
光电子学
结晶学
无机化学
化学
有机化学
计算机科学
程序设计语言
作者
Raja Sekhar Muddam,J. Sinclair,Lethy Krishnan Jagadamma
出处
期刊:Materials
[Multidisciplinary Digital Publishing Institute]
日期:2024-06-23
卷期号:17 (13): 3083-3083
被引量:5
摘要
Halide perovskites are an emerging family of piezoelectric and ferroelectric materials. These materials can exist in bulk, single-crystal, and thin-film forms. In this article, we review the piezoelectric charge coefficient (dij) of single crystals, thin films, and dimension-tuned halide perovskites based on different measurement methods. Our study finds that the (dij) coefficient of the bulk and single-crystal samples is mainly measured using the quasi-static (Berlincourt) method, though the piezoforce microscopy (PFM) method is also heavily used. In the case of thin-film samples, the (dij) coefficient is dominantly measured by the PFM technique. The reported values of dij coefficients of halide perovskites are comparable and even better in some cases compared to existing materials such as PZT and PVDF. Finally, we discuss the promising emergence of quasi-static methods for thin-film samples as well.
科研通智能强力驱动
Strongly Powered by AbleSci AI