材料科学
压电
导纳
电阻抗
结构健康监测
传感器
复合材料
压电传感器
胶粘剂
剪切(地质)
结构工程
声学
图层(电子)
工程类
电气工程
物理
作者
Suresh Bhalla,Chee Kiong Soh
标识
DOI:10.1177/1045389x04046309
摘要
The electromechanical impedance (EMI) technique for structural health monitoring (SHM) and nondestructive evaluation (NDE) employs piezoelectric-ceramic (PZT) patches, which are surface bonded to the monitored structures using adhesives. The adhesive forms a finitely thick, permanent interfacial layer between the host structure and the patch. Hence, the force transmission between the structure and the patch occurs through the bond layer, via shear mechanism, invariably causing shear lag. However, the impedance models developed so far ignore the associated shear lag and idealize the force transfer to occur at the ends of the patch. This paper analyses the mechanism of force transfer through the bond layer and presents a step-by-step derivation to integrate the shear lag effect into impedance formulations, both one-dimensional and two-dimensional. Further, using the integrated model, the influence of various parameters (associated with the bond layer) on the electromechanical admittance response is studied by means of a parametric study. It is found that the bond layer can significantly modify the measured electromechanical admittance if not carefully controlled during the installation of the PZT patch.
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