显微镜
材料科学
传输(电信)
透射电子显微镜
光学
计算机图形学(图像)
计算机科学
纳米技术
物理
电信
标识
DOI:10.1002/9783527834679.ch8
摘要
This chapter introduces the working principle of transmission X-ray microscope (TXM) and summarizes the work of TXM in the field of energy materials research in recent years. TXM measures the transmission X-ray after the X-ray passes through the sample. TXM is a unique and powerful tool that can provide two-dimensional morphology information of energy materials and devices in the length scale from tens of nanometers to tens of microns. The chemical mapping ability of TXM technology can detect the element distribution and heterogeneity of phase and oxidation states. In addition, in situ /operational characterization can be achieved by using TXM technology with sufficient time resolution, combined with non-destructive and high-penetration X-rays. These technologies, used in the synthesis and processing of energy materials, can help develop sustainable energy technologies and help design and optimize next-generation equipment.
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