底纹
太阳能电池
硅
光电子学
泄漏(经济)
串联
反向漏电流
电压
材料科学
计算机科学
电流(流体)
击穿电压
晶体硅
反向偏压
光学
电气工程
物理
计算机图形学(图像)
二极管
肖特基势垒
经济
复合材料
宏观经济学
工程类
作者
Carlos Enrico Clement,Jai Prakash Singh,Erik Birgersson,Yan Wang,Yong Sheng Khoo
标识
DOI:10.1109/jphotov.2021.3088005
摘要
In the modeling of PV modules under shading and low illumination, a complete description of reverse bias behavior at the cell level is critical to understanding module response. This is particularly important when dealing with high voltage configurations such as tandem and shingled modules. Current simulation studies often do not account for the effects of incident light when dealing with operating voltages approaching cell breakdown. In this article, we investigate the illumination dependence of leakage current at the onset of breakdown in crystalline silicon solar cells. A study of the most popular cell technologies in the market today reveals a light induced effect under reverse bias that is prominent for p-type and small for n-type cells. Additionally, this effect is found to be larger in mono c-Si than multi c-Si cells. Because this phenomenon is not captured in current breakdown models such as Bishop's equation, we propose a split-cell model to describe partial shading in p-type cells. The outlined approach divides the cell into two parallel regions and is advantageous for its procedural simplicity as well as its ability to generalize effects from complex shading profiles.
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