光刻胶
平版印刷术
化学机械平面化
纵横比(航空)
纳米技术
材料科学
光刻
抵抗
涂层
光电子学
图层(电子)
作者
Aránzazu del Campo,Christian Greiner
标识
DOI:10.1088/0960-1317/17/6/r01
摘要
SU-8 has become the favourite photoresist for high-aspect-ratio (HAR) and three-dimensional (3D) lithographic patterning due to its excellent coating, planarization and processing properties as well as its mechanical and chemical stability. However, as feature sizes get smaller and pattern complexity increases, particular difficulties and a number of material-related issues arise and need to be carefully considered. This review presents a detailed description of these effects and describes reported strategies and achieved SU-8 HAR and 3D structures up to August 2006.
科研通智能强力驱动
Strongly Powered by AbleSci AI