Uniformity of Electrical Parameters on MCT Epitaxy Film

For Hall measurement under different magnetic fields at LN2 temperature,Hg1-xCdxTe (MCT) film (radius 1cm) grown on CdTe substrate by LPE is photoengraved into many small Van Der Pauw squares,then their Hall coefficients and mobilities are measured and analyzed,respectively.Two films were Hall-tested during the temperature range from LHe 4.2K to about 200K.An actual impression on the uniformity of electrical parameters for MCT film can obtained by means of the methods presented in this paper.