计算机科学
闪存
闪光灯(摄影)
闪存文件系统
错误检测和纠正
极坐标
堆积
块(置换群论)
编码(集合论)
解码方法
计算机硬件
固态
算法
计算机存储器
半导体存储器
光学
工程类
数学
物理
集合(抽象数据类型)
核磁共振
工程物理
程序设计语言
几何学
作者
Yajuan Du,Ziye Wang,Yao Zhou,Taiyu Zhou
标识
DOI:10.1145/3555776.3577710
摘要
3D flash memory is becoming the mainstream of Solid-State Drives (SSDs) because of its large storage capacity achieved by vertically stacking planar flash into multiple layers. This special vertical structure introduces two additional error sources: the intra-wordline error variation between upper pages and lower pages inside the same wordlines, and the inter-layer error variation across different layers inside one flash block. Recent works have studied polar code in flash memory, which is the first Error Checking and Correcting (ECC) that is proven to reach the Shannon's channel capacity. However, due to the special error characteristic mentioned above, polar codes cannot display effective error correction capabilities in 3D flash.
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