Snapshot partial Mueller matrix imaging using spatial optical phase modulator

A measurement of Mueller matrix, which describes polarization characteristics of an object, is an important technique used in a wide range of fields, such as materials engineering and life sciences, as it enables non-contact acquisition of structural information inside a material and detailed surface optical properties. The Mueller matrix reflects optical properties such as birefringence, dichroism, circular dichroism, and depolarization. It is possible to extract higher-order structural information from conventional intensity measurements by analyzing these in detail. In this study, a method was proposed that combines two main devices, a spatial light modulator (SLM) and a polarization camera, to spatially control and detect polarization states. The potential of this method as an alternative to conventional time-division techniques was investigated. This system enables the simultaneous generation and detection of multiple polarization states, making it possible to image partial Mueller matrices on a snapshot basis. This demonstrates the feasibility of real-time Mueller matrix measurement.