Optical properties of WTe2-a layered topological insulator: A DFT study

To assess its suitability for optoelectronic applications, the structural, electronic, and optical characteristics of a 2H type of layered WTe2 topological insulator have been examined using first principles DFT simulations. We have utilized single to four layers of two-dimensional 2H WTe2 for this purpose. An intriguing behavior has been uncovered in our studies. For 2H WTe2, monolayer to quad layer have distinct values for many optical characteristics such as the real and imaginary parts of the dielectric function, absorption coefficient, refractive index, etc. Our findings show that stacked 2H WTe2 might be useful in the production of optoelectronic devices.