Defect Induced Polarization Loss in Multi‐Shelled Spinel Hollow Spheres for Electromagnetic Wave Absorption Application

-based material due to its more defect sites in spinel structure. It is discovered that electron spin resonance test may be adopted as a novel approach to directly probe EM wave absorption capacities of materials. This work not only provides a strategy to prepare lightweight, efficient EM wave absorber but also illustrates the importance of defect engineering on regulation of materials' dielectric loss capacity.