锡
薄膜
材料科学
欧姆接触
带隙
半导体
电阻率和电导率
溅射
铟
光电子学
分析化学(期刊)
冶金
复合材料
纳米技术
化学
图层(电子)
电气工程
工程类
色谱法
作者
М. Н. Солован,В. В. Брус,Э. В. Майструк,P. D. Maryanchuk
标识
DOI:10.1134/s0020168514010178
摘要
TiN thin films have been grown by reactive magnetron sputtering. It has been shown that an Ohmic contact to TiN thin-film can be made from indium. The TiN thin films have been shown to be n-type semiconductors with a carrier concentration of 2.88 × 1022 cm−3 and resistivity of ρ = 0.4 Ω cm at room temperature. The activation energy for conduction in the TiN films at temperatures in the range 295 K < T < 420 K is 0.15 eV. The optical properties of the TiN thin films have been investigated. The material of the TiN thin films has been shown to be a direct gap semiconductor with a band gap E g = 3.4 eV.
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