Lead zirconate titanate (PZT) thin films were prepared on platinized silicon substrates by dip‐coating using a modified diol‐based sol–gel route without and with up to 5 mol% PZT nanometric seeds dispersed in the precursor sol. A metastable intermetallic Pt x Pb phase formed at the early stages of heat treatment. XRD, TEM, and RBS revealed that the thickness and stoichiometry of the Pt x Pb layer varied with the concentration of seeds and heat treatment of the films. The relation of the Pt x Pb layer to the final crystalline texture of the PZT thin films is reported and discussed.