折射率
材料科学
色散(光学)
光学
波长
残余物
折射
分析化学(期刊)
化学
数学
物理
光电子学
色谱法
算法
标识
DOI:10.1364/josa.55.001205
摘要
The index of refraction of optical quality fused silica (SiO2) was determined for 60 wavelengths from 0.21 to 3.71 μ at 20°C. The dispersion equation n2-1=0.6961663λ2λ2-(0.0684043)2+0.4079426λ2λ2-(0.1162414)2+0.8974794λ2λ2-(9.896161)2.where λ is expressed in microns was found to yield an absolute residual of 10.5×10−6. The variation in index between 12 specimens was determined. Dispersive properties of the material and thermal coefficient of index are graphically presented. A comparison with previous NBS index data is discussed.
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