材料科学
光探测
光电子学
宽带
异质结
窄带
响应度
极化(电化学)
光电探测器
电压
光学
光子学
光谱带
光谱分辨率
电子能带结构
光谱形状分析
自由光谱范围
光子晶体
带宽(计算)
红外线的
探测器
范德瓦尔斯力
分光计
作者
Mingyan Qin,Junpeng Zhu,Yuting Zou,Mingxiu Liu,Chunlu Chang,Huaiyu Xiang,Yaru Shi,Weijia Wang,Xilang Shen,Shaojuan Li
摘要
ABSTRACT Spectral information, reflecting the interaction between light and matter across different wavelengths, is essential for identifying material properties and environmental changes. To meet the demand for compact spectral sensors, we constructed a type‐I band‐aligned MoTe 2 /Te van der Waals (vdW) heterostructure through precise band structure design, where the drain–source voltage ( V ds ) electrostatically tunes interfacial band alignment to complement gate voltage ( V gs ) modulation. By synergistically tuning the V gs and V ds , we achieved a wavelength‐dependent photoresponse and constructed a spectral responsivity matrix. Integrated with an attention‐guided multilayer perceptron (MLP) algorithm that incorporates the device's responsivity as prior physical information, the device functions as a miniaturized spectrometer, demonstrating narrowband spectral reconstruction with an optimal resolution of 6 nm across a broadband range from 500 to 780 nm at room temperature. The noncentrosymmetric crystal structure of Te also endows the device with the capability of simultaneous polarization discrimination. This work provides a promising approach toward multifunctional on‐chip spectrometers capable of simultaneous spectral and polarization analysis.
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