无杂散动态范围
逐次逼近ADC
比较器
CMOS芯片
最低有效位
计算机科学
电容器
模数转换器
电子工程
电气工程
电压
工程类
操作系统
作者
Wei-Hsin Tseng,Wei‐Liang Lee,Changyang Huang,Pao-Cheng Chiu
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2016-10-01
卷期号:51 (10): 2222-2231
被引量:61
标识
DOI:10.1109/jssc.2016.2582861
摘要
A 12-bit 104 MS/s successive approximation register analog-to-digital converter (SAR ADC) is developed for a digitally-assisted wireless transmitter system for use in cellular applications. A power-on calibration method is implemented to correct capacitor DAC mismatch and reduce capacitor size, thereby lowering the current consumption of the input buffer and reference generator. The total capacitor size is reduced to 0.6 pF, from the 3.6 pF required for 12-bit matching. The ADC analog core area is 0.003 mm 2 . The proposed method achieves 88 dB SFDR at 26 MHz sampling rate and 76.2 dB SFDR at 104 MHz sampling rate after calibration. The measured DNL and INL are 0.5 LSB and 1.1 LSB, respectively. The ADC achieves both high speed and low power by combining several features, namely digital calibration, redundancy, asynchronous bit-cycling, monotonic switching, 25% duty-cycle sampling period, 3 dB input gain, and a fully dynamic comparator. The power consumption from 1.2 V/1.1 V supplies is 0.88 mW for a single ADC core and 6.1 mW for the entire I/Q ADC, including the reference generator and input buffers. The ADC is fabricated in 28 nm CMOS.
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