X射线光电子能谱
结合能
化学吸附
谱线
化学
簇大小
星团(航天器)
航程(航空)
材料科学
分析化学(期刊)
原子物理学
电子结构
吸附
物理化学
核磁共振
计算化学
物理
天文
色谱法
计算机科学
复合材料
程序设计语言
作者
S. Peters,Sergey Peredkov,M. Neeb,W. Eberhardt,M. Al‐Hada
标识
DOI:10.1016/j.susc.2012.09.024
摘要
High resolution XPS spectra (4f) of mass-selected AuN-clusters supported by a thin natural silica layer are presented in the size range N = 1–35 atoms per cluster. The XPS binding energy as well as peak width is found to increase systematically with decreasing cluster size. Furthermore a size-dependent asymmetry is observed on the high energy tail of the photoemission peaks. Analysing the XPS shift and line shape using the dynamic electrostatic model helps to identify initial and final state effects such as negative surface core level shift, inhomogeneous broadening, dynamic final-state screening and chemisorption-like interaction between cluster and support.
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