旋光法
各向异性
线性二色性
线极化
材料科学
极化(电化学)
范德瓦尔斯力
光学
光电子学
反射计
物理
散射
圆二色性
计算机科学
时域
量子力学
物理化学
化学
分子
计算机视觉
激光器
结晶学
作者
Wenjie Deng,Mingjin Dai,Chongwu Wang,Congya You,Wenduo Chen,Song Han,Jiayue Han,Fakun Wang,Ming Ye,Song Zhu,Jieyuan Cui,Qi Jie Wang,Yongzhe Zhang
标识
DOI:10.1002/adma.202203766
摘要
Polarization-resolved photodetection in a compact footprint is of great interest for ultraminiaturized polarimeters to be used in a wide range of applications. However, probing the states of polarization (SOP) in materials with natural anisotropy are usually weak, limited by the material's natural dichroism or diattenuation. Here, a twisted unipolar-barrier van der Waals heterostructure (vdWH) to construct a bias-switchable polarization detection for retrieval of full SOP (from 0 to 180°) for linear polarized incident light is reported. As a demonstration example, this study realizes the concept in a b-AsP/WS2 /b-AsP vdWH relying on the natural anisotropic properties of the materials without using additional plasmonic/metasurface nanostructures to realize linear polarimetry in the mid-infrared range. Polarimetric imaging is further demonstrated with the developed linear polarimetry by directly displaying the Jones-vector-described SOP distribution of certain target object. This method, with the capabilities of detecting full linear SOP, is promising for the next-generation on-chip miniaturized polarimeters.
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