化学气相沉积
材料科学
X射线光电子能谱
拉曼光谱
二硫化钼
纳米技术
原子层沉积
光致发光
剥脱关节
扫描电子显微镜
扫描透射电子显微镜
透射电子显微镜
图层(电子)
石墨烯
光电子学
化学工程
光学
复合材料
工程类
物理
作者
Hung Q. Nguyen,Chih‐Fang Huang,Weijun Luo,Guangrui Xia,Zhiqiang Chen,Zhiqiang Li,Christopher Raymond,David Doyle,Feng Zhao
标识
DOI:10.1016/j.matlet.2015.12.068
摘要
As one of the two-dimensional (2-D) transition metal dichalcogenides, atomically thin molybdenum disulfide (MoS2) has attracted significant attention and research interests for micro and nanoelectronic applications. Significant efforts have been made to develop different approaches in order to obtain atomic layer MoS2, such as exfoliation, chemical synthesis, and physical or chemical vapor deposition (CVD) processes. In this paper, we report a hydrogen-free and promoter-free CVD growth to synthesize large-area MoS2 atomic layers. A variety of techniques including optical microscopy (OM), atomic force microscopy (AFM), photoluminescence (PL) mapping, Raman and x-ray photoelectron spectroscopy (XPS), high resolution electron microscopy (HREM) and scanning transmission electron microscopy (STEM) were applied to characterize the film quality, uniformity and layer numbers. High quality centimeter-sized MoS2 atomic layers were demonstrated, which form a foundation to develop wafer-sized material platform for device fabrication and production.
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