Cultivar Classification of Single Sweet Corn Seed Using Fourier Transform Near-Infrared Spectroscopy Combined with Discriminant Analysis

Seed purity is a key indicator of crop seed quality. The conventional methods for cultivar identification are time-consuming, expensive, and destructive. Fourier transform near-infrared (FT-NIR) spectroscopy combined with discriminant analyses, was studied as a rapid and nondestructive technique to classify the cultivars of sweet corn seeds. Spectra with a range of 1000–2500 nm collected from 760 seeds of two cultivars were used for the discriminant analyses. Thereafter, 126 feature wavelengths were identified from 1557 wavelengths using a genetic algorithm (GA) to build simplified classification models. Four classification algorithms, namely K-nearest neighbor (KNN), soft independent method of class analogy (SIMCA), partial least-squares discriminant analysis (PLS-DA), and support vector machine discriminant analysis (SVM-DA) were tested on full-range wavelengths and feature wavelengths, respectively. With the full-range wavelengths, all four algorithms achieved a high classification accuracy range from 97.56% to 99.59%, and the SVM-DA worked better than other models. From the feature wavelengths, no significant decline in accuracies was observed in most of the models and a high accuracy of 99.19% was still obtained by the PLS-DA model. This study demonstrated that using the FT-NIR technique with discriminant analyses could be a feasible way to classify sweet corn seed cultivars and the proper classification model could be embedded in seed sorting machinery to select high-purity seeds.